Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein , Dale E.Newbury, Joseph R.Michael, Nicholas W.M.Ritchie, John Henry J.Scott, David C.Joy.
Material type: TextPublisher: New York : Springer, 2018Copyright date: ©2018Edition: Fourth editionDescription: xxiii, 550 pages : illustrations (black and white, and colour) ; 28 cmContent type:- text
- unmediated
- volume
- 9781493966745
- 502.825 23
- QH212.S3 G65 2018
- 502.825
- Legacy 2018
Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Nevypožičateľné | Knižnica polygrafie a aplikovanej fotochémie (VIII/b) | Zahraničná kúpa | schkA2021/102604 | Not for loan | schkA2021/102604 |
Previous edition: New York: Plenum Press, 2003.
Includes bibliographical references and index.
Legacy 2018 UoY