Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein , Dale E.Newbury, Joseph R.Michael, Nicholas W.M.Ritchie, John Henry J.Scott, David C.Joy.

By: Contributor(s): Material type: TextTextPublisher: New York : Springer, 2018Copyright date: ©2018Edition: Fourth editionDescription: xxiii, 550 pages : illustrations (black and white, and colour) ; 28 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9781493966745
Subject(s): DDC classification:
  • 502.825 23
LOC classification:
  • QH212.S3 G65 2018
Other classification:
  • 502.825
Action note:
  • Legacy 2018
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Holdings
Item type Current library Collection Call number Status Date due Barcode
Nevypožičateľné Knižnica polygrafie a aplikovanej fotochémie (VIII/b) Zahraničná kúpa schkA2021/102604 Not for loan schkA2021/102604

Previous edition: New York: Plenum Press, 2003.

Includes bibliographical references and index.

Legacy 2018 UoY

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