TY  - BOOK
AU  - Goldstein,Joseph
AU  - Newbury,Dale E.
AU  - Michael,Joseph R.
AU  - Ritchie,Nicholas W.M.
AU  - Scott,John Henry J.
AU  - Joy,David C.
TI  - Scanning electron microscopy and x-ray microanalysis
SN  - 9781493966745
AV  - QH212.S3 G65 2018
U1  - 502.825 23
PY  - 2018///
CY  - New York
PB  - Springer
KW  - Scanning electron microscopy
KW  - X-ray microanalysis
N1  - Previous edition: New York: Plenum Press, 2003; Includes bibliographical references and index
ER  -